A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.
Keywords:
carrier dynamics
,real-space imaging
,nanowires
,carrier diffusion
,ultrafast electron microscopy
,surface dynamics
,InGaN
